Patent overlay mapping: Visualizing technological distance

Luciano Kay, Center for Nanotechnology in Society, University of California Santa Barbara, Santa Barbara, CA, USA, e-mail: [email protected] Nils Newman, Intelligent Information Services Corporation, Atlanta, GA, USA, email: [email protected] Jan Youtie, Enterprise Innovation Institute & School of Public Policy, Atlanta, GA, USA, e-mail: [email protected] Alan L. Porter, School of Public Policy, Georgia Institute of Technology, Atlanta GA & Search Technologies, Norcross, GA, USA, e-mail: [email protected] Ismael Rafols,Ingenio (CSIC-UPV), UniversitatPolitècnica de València, València, Spain & SPRU – Science and Technology Policy Research, University of Sussex, Brighton, England, e-mail: [email protected]